List of bibliographic references indexed by Depth resolution
Number of relevant bibliographic references: 3.
Ident. | Authors (with country if any) | Title |
---|
003298 (2015) |
Laure Sangely [France, Allemagne] ; Bernard Boyer [France, Allemagne] ; Emmanuel De Chambost [France, Allemagne] ; Nathalie Valle [France, Allemagne] ; Jean-Nicolas Audinot [France, Allemagne] ; Trevor Ireland [France, Allemagne] ; Michael Wiedenbeck [France, Allemagne] ; Jérôme Aléon [France, Allemagne] ; Harald Jungnickel [France, Allemagne] ; Jean-Paul Barnes [France, Allemagne] ; Philippe Bienvenu [France, Allemagne] ; Uwe Breuer [France, Allemagne] | CHAPTER 15 - Secondary Ion Mass Spectrometry |
00AE85 (2003) |
Philippe Le Coustumer [France] ; Mikael Motelica-Heino [France] ; Patrick Chapon [France] ; Hugues François Saint-Cyr [États-Unis] ; Richard Payling [Australie] | Surface characterization and depth profile analysis of glasses by r.f. GDOES |
00CE78 (1997) |
Andrzej Bernasik [France] ; Janusz Nowotny [Australie] ; Stanislas Scherrer [France] ; Sylvian Weber [France] | Application of the SIMS Method in Studies of Cr Segregation in Cr‐Doped CoO: I, Aspects of Quantitative Analysis |
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